Inspection & Metrology
Focusing on Massive Image Processing and Precise Identification for Optical & E-beam Inspection
Key Advantages
Built for reliable, long-term semiconductor equipment operation.
- Full-Rack Integration with Multi-sensor Protection
- Advanced Air and Liquid Cooling from 30KW to 80KW
- Certified SEMI S2 Compliance
Technical Features
High-performance AI computing for data-intensive inspection workloads.
- High-Density 2U/4U Edge AI Server with 4–8 GPUs
- Ultra-Fast 50 Gbps Image Acquisition and Streaming
- High-Performance Computing with 2,880 TFLOPS
Key Application Areas
Supporting critical inspection processes across semiconductor manufacturing.
- Wafer Surface Defect Inspection
- EUV Mask & Pod Inspection
- Advanced Packaging Inspection
AI AOI & Machine Vision
Advantech’s Vision AI Solutions enable precise OCR, recognition, and defect detection with integrated tools for streamlined AI deployment.
Motion Control
Advantech’s Motion Control Solutions enable precise multi-axis coordination with high-speed EtherCAT control for complex manufacturing processes.
HMI Visulization
Advantech’s HMI Solutions provide reliable, flexible visualization and control for semiconductor manufacturing equipment.
Automation Control Platform
Advantech’s Automation Control Platforms combine APC and EtherCAT for precise, reliable real-time control in semiconductor manufacturing.
Industrial Ethernet Switch & Wireless Network
Advantech’s Industrial Connectivity Solutions provide high-speed, reliable networking for real-time communication across advanced packaging systems.
Data Acquisition
Advantech’s DAQ Solutions provide flexible, reliable data acquisition for automation, testing, and real-time monitoring.
Reliable Intelligent Systems
Advantech’s Automation Computers, IPCs, and Servers deliver reliable, high-performance computing for semiconductor and electronics manufacturing.
Industrial Servers
Advantech’s Industrial Servers deliver scalable, high-performance computing for demanding industrial applications.
Case Studies
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