Inspection & Metrology

Focusing on Massive Image Processing and Precise Identification for Optical & E-beam Inspection

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Advantech enables next-generation AOI and metrology systems with high-performance edge computing platforms designed for real-time image acquisition, AI inference, and ultra-low-latency data processing in semiconductor manufacturing environments. As semiconductor inspection workflows become increasingly data-intensive, manufacturers require scalable computing infrastructure capable of handling high-speed image streams, complex defect classification, and real-time decision-making directly at the edge.  Advantech’s GPU-accelerated edge servers and industrial computing platforms provide the performance, reliability, and long lifecycle support needed for advanced AOI applications across wafer inspection, metrology, and packaging processes.

Benefits

Heterogeneous Computing & Image Reconstruction

Utilizing CPU+GPU heterogeneous architecture to accelerate 3D image reconstruction algorithms.

High-Throughput I/O & Massive RAW Data Stream

Supporting Quad CXP-12 interface to sustain tens of gigabytes per second of real-time image streaming.

Deep Learning-based Auto Defect Classification (ADC)

Introducing deep learning to achieve automatic defect classification with ultra-low false alarm rates.

Sub-Nanometer Synchronization & Triggering

Achieving precise synchronization and triggering between camera shutters and nanometer-scale displacement stages.

Next Generation Semiconductor AI AOI Inspection Solution

Industrial Vision AI enables automated inspection, real-time process control, and intelligent safety monitoring across semiconductor and electronics manufacturing. By combining defect detection, object localization, classification, and video analytics, it helps improve precision, quality control, and production efficiency.

Key Advantages

Built for reliable, long-term semiconductor equipment operation.

  • Full-Rack Integration with Multi-sensor Protection
  • Advanced Air and Liquid Cooling from 30KW to 80KW
  • Certified SEMI S2 Compliance

Technical Features

High-performance AI computing for data-intensive inspection workloads.

  • High-Density 2U/4U Edge AI Server with 4–8 GPUs
  • Ultra-Fast 50 Gbps Image Acquisition and Streaming
  • High-Performance Computing with 2,880 TFLOPS

Key Application Areas

Supporting critical inspection processes across semiconductor manufacturing.

  • Wafer Surface Defect Inspection
  • EUV Mask & Pod Inspection
  • Advanced Packaging Inspection

Application

  • Wafer Inspection for Front-end Semiconductor Manufacturing

    Vision AI enables high-speed, high-precision inspection across front-end semiconductor processes, from wafer defect detection and pattern alignment to advanced feature inspection. Advantech provides the high-performance edge computing and image-processing infrastructure required to process large volumes of inspection data in real time.

  • Advantech's High-End AI AOI Solutions

    Advantech provides high-performance edge AI computing for demanding semiconductor inspection workloads. Server-grade Intel® Xeon® processors, GPU acceleration, and high-speed frame grabbers enable real-time processing of high-resolution image streams and scalable multi-camera configurations. The modular architecture gives equipment builders the computing performance and flexibility required for advanced AI-based inspection and defect classification.

  • Target Applications: Large-Area and High-Speed Inspection

    • Automated inline wafer inspection
    • Web inspection and line scan AI inspection
    • PCB board inspection
    • Large-scale inference

  • Recommended Solution: Server-Grade Edge AI Computing

    • High-end edge AI inference system: Short-Depth Edge Accelerator Server with Scalable Processors.
    • Frame Grabber Card: Axion Family, supporting Camera Link interfaces for real-time high-resolution imaging.
    • GPU Card: NVIDIA RTX GPU cards to handle complex AI computations in visual inspections.

  • Multi-Camera High-Speed Inspection for Electronic Components

    Vision AI enables high-speed, precise inspection across semiconductor manufacturing, detecting surface defects, misalignment, and quality anomalies. Advanced image processing and AI-driven analysis help improve inspection accuracy, accelerate defect detection, and maintain consistent product quality.

  • Advantech's Flexibility and Powerful Modular Vision System

    Advantech combines industrial-grade computing, DAQ, frame grabbers, and GPU acceleration to support high-speed, high-precision inspection. The scalable architecture enables reliable image acquisition and AI-driven visual analysis for efficient defect detection and quality control.

  • Target Applications: Component AI AOI Inspection

    • Automated wafer and semiconductor inspection
    • Surface defect and anomaly detection
    • High-speed, high-resolution area scanning
    • AI-driven defect classification and quality control

  • Recommended Solution: Modular Design for Edge AI

    • CPU/GPU Computing: Industrial-grade IPC supporting high-performance GPU acceleration
    • DAQ Cards: Reliable data acquisition for inspection and measurement
    • Frame Grabber Cards: High-speed, high-resolution image acquisition
    • GPU Acceleration: AI inference and complex visual processing
    • Industrial AI Cameras: High-resolution imaging with flexible industrial connectivity

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Reliable Intelligent Systems

Advantech’s Automation Computers, IPCs, and Servers deliver reliable, high-performance computing for semiconductor and electronics manufacturing.



Industrial Servers

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Case Studies

Advantech Wafer Inspection Solution for Semiconductor Factory

A global semiconductor company that has been providing advanced surface defects inspection systems such as wafer inspection, optical surface analyzers, and HDD defect detection, needed to upgrade its operating systems as well as its hardware for new more advanced projects.

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Wafer Optical Inspection Solution for Semiconductor Front-End Manufacturing

Advantech’s Machine Vision Inspection System integrates the global shutter, high speed industrial cameras, a multi-channel computing platform, and vision software, so that users don’t need to worry about how to select compatible products.

More Information

Advantech Automated Optical Inspection System Powered by AMD Ryzen™ Embedded Processors

The customer must simultaneously capture multiple video streams from industrial cameras and acquire factory sensor/control signals, all while maintaining separate network segments with redundancy. Additionally, the system must perform real-time defect detection, optical character recognition (OCR), and log all operator actions for traceability.

More Information

Advantech Use Cases


 

Explore how Advantech’s AI AOI and vision solutions enable faster, more precise semiconductor inspection and metrology.


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